BEEM spectra of various Au-Si samples and their analysis

A. Thiaville (), F. Caud, C. Vouille and J. Miltat

The European Physical Journal B: Condensed Matter and Complex Systems, 2007, vol. 55, issue 1, 29-36

Abstract: Ballistic electron emision microscopy spectra have been measured at room temperature on Au films deposited on the Si(111)-H surface by different procedures. In order to analyze them in detail, we propose a fully analytical description of these spectra, directly based on the phase-space model of Bell and Kaiser. This allows fitting experimental data over a wide voltage range, comprising the threshold and the quasi-linear regions. Two main independent parameters are extracted from the fits, namely the effective Schottky barrier height and hot-electron transmission of the sample. These show a clear variation with sample preparation conditions. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007

Keywords: 68.37.Uv Near-field scanning microscopy and spectroscopy; 73.40.Qv Metal-insulator-semiconductor structures (including semiconductor-to-insulator); 72.15.-v Electronic conduction in metals and alloys (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1140/epjb/e2007-00037-3

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