Enhanced fluxon transmission through impurities

Y. Zolotaryuk ()

The European Physical Journal B: Condensed Matter and Complex Systems, 2008, vol. 62, issue 3, 349-355

Abstract: Fluxon transmission through several impurities of different strength and type (i.e., microshorts and microresistors), placed in a long Josephson junction is investigated. Retrapping current on the impurities is computed as a function of the distance between them, their amplitudes and the dissipation parameter. It is shown that in the case of consequently placed microshorts or microresistors, the retrapping current exhibits a clear minimum as a function of the distance between the impurities. In the case of a microresistor, followed by a microshort, an opposite phenomenon is observed, namely the retrapping current exhibits maximum as a function of the distance between the impurities. Copyright EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2008

Keywords: 03.75.Lm Tunneling, Josephson effect, Bose-Einstein condensates in periodic potentials, solitons, vortices, and topological excitations, 05.45.Yv Solitons, 74.50.+r Tunneling phenomena; point contacts, weak links, Josephson effects, (search for similar items in EconPapers)
Date: 2008
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DOI: 10.1140/epjb/e2008-00152-7

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