Thermal cycles, interface chemistry and optical performance of Mg/SiC multilayers
H. Maury,
P. Jonnard (),
K. Guen,
J. André,
Z. Wang,
J. Zhu,
J. Dong,
Z. Zhang,
F. Bridou,
F. Delmotte,
C. Hecquet,
N. Mahne,
A. Giglia and
S. Nannarone
The European Physical Journal B: Condensed Matter and Complex Systems, 2008, vol. 64, issue 2, 193-199
Keywords: 68.65.Ac Multilayers, 61.05.cm X-ray reflectometry (surfaces, interfaces, films), 78.70.En X-ray emission spectra and fluorescence, 73.90.+f Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures, 66.30.Ny Chemical interdiffusion; diffusion barriers, 68.35.Fx Diffusion; interface formation, (search for similar items in EconPapers)
Date: 2008
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Persistent link: https://EconPapers.repec.org/RePEc:spr:eurphb:v:64:y:2008:i:2:p:193-199
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DOI: 10.1140/epjb/e2008-00290-x
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