Terminal reliability analysis of multistage interconnection networks

Amit Prakash (), Dilip Kumar Yadav () and Arvind Choubey ()
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Amit Prakash: National Institute of Technology, Jamshedpur
Dilip Kumar Yadav: National Institute of Technology, Jamshedpur
Arvind Choubey: IIIT Bhagalpur

International Journal of System Assurance Engineering and Management, 2020, vol. 11, issue 1, No 9, 110-125

Abstract: Abstract Terminal reliability of multistage interconnection network (MIN) is the probability of at least one fault free path between any source–destination nodes pair. MIN is used to interconnect processors and memory modules in multi-processor system. In this paper, terminal reliability is estimated and validated for existing MINs (i.e., SEN, SEN+, SEN+2, GIN, CGIN, PCGIN, 3D-GIN, 4D-GIN-1, 4D-GIN-2, 4D-GIN-3, and SEGINs). The comparison and performance analysis of MINs based on various indices are also presented.

Keywords: Multistage interconnection network; Reliability block diagram; Terminal reliability; Network complexity; Fault-tolerant (search for similar items in EconPapers)
Date: 2020
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DOI: 10.1007/s13198-019-00929-z

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