Integrating Burr type testing effort functions in logistic reliability growth model with uncertainty factor

Javaid Iqbal (), Nyla Manzoor (), Avinash K. Shrivastava () and Ishfaq A. Malik ()
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Javaid Iqbal: University of Kashmir
Nyla Manzoor: University of Kashmir
Avinash K. Shrivastava: International Management Institute Kolkata
Ishfaq A. Malik: University of Kashmir

International Journal of System Assurance Engineering and Management, 2023, vol. 14, issue 6, No 26, 2365-2375

Abstract: Abstract Software reliability growth models are modelled using a string of parameters and a set of assumptions. The fact that most of these models don’t typically take into consideration the uncertainty in the assumptions and parameters is a significant issue. Therefore, sometimes, the expected reliability in testing phase drastically varies in real operational phase. The existing logistic growth model under consideration in this study has a built-in explicit uncertainty factor covering for the effects of any uncertainties. In this paper, additionally, Burr type X and Burr type XII testing effort functions are integrated into the Logistic growth model to obtain new models having both Testing Effort Functions and uncertainty factors. By validating the proposed models on two real-world datasets, the applicability of the two proposed models is demonstrated. In terms of six comparison criteria, comparisons with some well-established models are foregrounded.

Keywords: Software reliability; SRGM; Software testing; Testing effort function (TEF); Project management (search for similar items in EconPapers)
Date: 2023
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DOI: 10.1007/s13198-023-02084-y

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