Statistical analysis using multiple censoring scheme under partially accelerated life tests for the power Lindley distribution

Intekhab Alam (), Mustafa Kamal (), Ahmadur Rahman (), Trapty Agarwal () and Awakash Mishra ()
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Intekhab Alam: Maharishi University of Information Technology
Mustafa Kamal: Saudi Electronic University
Ahmadur Rahman: Aligarh Muslim University
Trapty Agarwal: Maharishi University of Information Technology
Awakash Mishra: Maharishi University of Information Technology

International Journal of System Assurance Engineering and Management, 2024, vol. 15, issue 7, No 42, 3424-3436

Abstract: Abstract If the items are very reliable, assessing the lifetime of them in regular usage requires more time and money than in accelerated conditions. As a result, life testing studies benefit greatly from accelerated life testing (ALT) since it saves time and money. In ALT, the components are subjected to higher levels of stress than usual in order to detect early failures in a short period of time and so decrease the expenses associated with component testing while maintaining quality. In this paper, a problem-based constant stress partially accelerated life test for multiple censored data is investigated. Under normal and accelerated settings, failure data from test objects is supposed to follow the Power Lindley distribution. The maximum likelihood estimates (MLEs) are obtained by solving the likelihood equations numerically. The approximate confidence intervals for the parameters are calculated using a normal approximation to the asymptotic distribution of MLEs. A simulation study is then used to test and validate the estimators' performance.

Keywords: Constant stress partially accelerated life tests; Power Lindley distribution; Multiple censoring; Fisher information matrix; Simulation study (search for similar items in EconPapers)
Date: 2024
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DOI: 10.1007/s13198-024-02350-7

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