Time truncated attribute control chart using acceptance sampling plans: a comparative study

Mahendra Saha, Pratibha Pareek (), Harsh Tripathi and Anju Devi
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Mahendra Saha: University of Delhi
Pratibha Pareek: Central University of Rajasthan
Harsh Tripathi: Symbiosis International (Deemed University)
Anju Devi: Maa Shakumbhari University

International Journal of System Assurance Engineering and Management, 2025, vol. 16, issue 12, No 2, 3863-3880

Abstract: Abstract In this article, a time truncated attribute control chart is proposed for generalized Rayleigh distribution based on multiple dependent state repetitive sampling plan ( $$\mathcal {MDSRSP}$$ MDSRSP ). The performance of the proposed control chart is evaluated in terms of average run length ( $$\mathcal {ARL}$$ ARL ). Furthermore, the efficiency of the proposed attribute control chart is compared with other sampling plans, viz., the single sampling plan ( $$\mathcal {SSP}$$ SSP ), multiple dependent state sampling plan ( $$\mathcal {MDSSP}$$ MDSSP ), repetitive sampling plan ( $$\mathcal {RSP}$$ RSP ) for shifts in the median lifetime. Also, the applications of the proposed control chart are illustrated by using hypothetical and simulated examples as well as two real life examples, respectively.

Keywords: Average run length; Generalized Rayleigh distribution; Multiple dependent state sampling plan; Multiple dependent state repetitive sampling plan; Number of failure; Median lifetime; Repetitive sampling plan (search for similar items in EconPapers)
Date: 2025
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DOI: 10.1007/s13198-025-02893-3

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