A simple Bayes analysis of Weibull Based Accelerated Test model

Rijji Sen (), Rakesh Ranjan and S. K. Upadhyay
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Rijji Sen: Banaras Hindu University
Rakesh Ranjan: Banaras Hindu University
S. K. Upadhyay: Banaras Hindu University

International Journal of System Assurance Engineering and Management, 2017, vol. 8, issue 1, No 47, 505-511

Abstract: Abstract This paper considers a simple Bayes analysis of a two-parameter Weibull distribution in an accelerated test scenario when the scale parameter is regressed according to power law relationship. The analysis is done using independent, vague priors for the parameters. Experiments involving both complete and censored data sets are assumed from the model. Appropriate numerical illustrations are provided using real datasets. The results are found to be satisfactory.

Keywords: Weibull model; Scale and shape parameters; Accelerated testing; Gibbs sampler; Censored data; Posterior estimates (search for similar items in EconPapers)
Date: 2017
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DOI: 10.1007/s13198-015-0389-8

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