Optimum quadratic step-stress accelerated life test plan for Weibull distribution under type-I censoring

N. Chandra (), Mashroor Ahmad Khan and G. Gopal
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N. Chandra: Pondicherry University
Mashroor Ahmad Khan: Pondicherry University
G. Gopal: Madras School of Economics

International Journal of System Assurance Engineering and Management, 2017, vol. 8, issue 2, No 4, 585-591

Abstract: Abstract This paper presents the optimum stress changing times for 3-step, step stress accelerated life testing under the cumulative exposure model with type-I censoring. The lifetimes of test units are assumed to follow Weibull distribution. The scale parameter of the Weibull failure time at constant stress level is assumed to be a log-quadratic function of the stress level. We derive an optimum test plans to minimize the asymptotic variance of maximum likelihood estimator of given pth percentile of the distribution at a design stress. The optimum test plan based on simulated observations is illustrated through a numerical example. The maximum likelihood estimates and asymptotic interval estimates are obtained using R software.

Keywords: Accelerated life testing; Weibull distribution; Asymptotic variance; Maximum likelihood estimate; Cumulative exposure model; Quadratic relationship; Type-I censoring (search for similar items in EconPapers)
Date: 2017
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Citations: View citations in EconPapers (1)

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DOI: 10.1007/s13198-016-0473-8

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