Estimation and testing procedures for the reliability functions of a family of lifetime distributions based on records

Ajit Chaturvedi and Ananya Malhotra ()
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Ajit Chaturvedi: University of Delhi
Ananya Malhotra: University of Delhi

International Journal of System Assurance Engineering and Management, 2017, vol. 8, issue 2, No 25, 836-848

Abstract: Abstract A family of lifetime distributions is considered. Two measures of reliability are considered, R(t) = P(X > t) and P = P(X > Y). Point estimation and testing procedures are developed for R(t) and P based on records. Two types of point estimators are developed—uniformly minimum variance unbiased estimators and maximum likelihood estimators. A comparative study of different methods of estimation is done through simulation studies. Testing procedures are developed for the hypothesis related to different parametric functions.

Keywords: Family of lifetime distributions; Point estimation; Testing procedures; Records; Simulation studies (search for similar items in EconPapers)
Date: 2017
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DOI: 10.1007/s13198-016-0531-2

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