Estimation of a log-linear model for the reliability assessment of products under two stress variables
Luis Alberto Rodríguez-Picón () and
Víctor Hugo Flores-Ochoa ()
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Luis Alberto Rodríguez-Picón: Autonomous University of Ciudad Juárez
Víctor Hugo Flores-Ochoa: Technological Institute of Ciudad Juárez
International Journal of System Assurance Engineering and Management, 2017, vol. 8, issue 2, No 39, 1026-1040
Abstract:
Abstract In this article, different models for reliability inference of devices affected by more than one accelerating variable in accelerated life tests are presented. General log-linear relationship is modeled with the lognormal and Weibull distributions considering the effect of two accelerating variables. Estimation of the parameters is performed via maximum likelihood estimation using the Newton–Raphson algorithm and through a Bayesian approach defining conjugate prior and initial non-informative distributions. In order to illustrate these models, an example is presented based on an accelerated life test applied to resistances. Obtained results show that although there are slight differences in the estimates of the parameters based on the two models and approaches, it can be noted that they have an important impact in the reliability inference. The best model and estimation approach is selected via information criteria. In addition, reliability information is obtained from the device under study.
Keywords: General log-linear; Accelerated life test; Multi-stress; MLE; Bayesian; Information criteria (search for similar items in EconPapers)
Date: 2017
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Persistent link: https://EconPapers.repec.org/RePEc:spr:ijsaem:v:8:y:2017:i:2:d:10.1007_s13198-016-0564-6
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DOI: 10.1007/s13198-016-0564-6
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