Retraction Note: Capacitance pin defect detection based on deep learning

Cheng Cheng (), Ning Dai, Jie Huang, Yahong Zhuang, Tao Tang and Longlong Liu
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Cheng Cheng: Nanjing Vocational University of Industry Technology
Ning Dai: Nanjing University of Aeronautics and Astronautics
Jie Huang: Nanjing Vocational University of Industry Technology
Yahong Zhuang: Nanjing Vocational University of Industry Technology
Tao Tang: Nanjing Vocational University of Industry Technology
Longlong Liu: Nanjing Vocational University of Industry Technology

Journal of Combinatorial Optimization, 2024, vol. 47, issue 3, No 23, 1 pages

Date: 2024
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DOI: 10.1007/s10878-024-01130-0

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