Precise Large Deviations of Random Sums in Presence of Negative Dependence and Consistent Variation
Yiqing Chen (),
Kam C. Yuen and
Kai W. Ng
Additional contact information
Yiqing Chen: The University of Liverpool
Kam C. Yuen: The University of Hong Kong
Kai W. Ng: The University of Hong Kong
Methodology and Computing in Applied Probability, 2011, vol. 13, issue 4, 821-833
Abstract:
Abstract The study of precise large deviations for random sums is an important topic in insurance and finance. In this paper, we extend recent results of Tang (Electron J Probab 11(4):107–120, 2006) and Liu (Stat Probab Lett 79(9):1290–1298, 2009) to random sums in various situations. In particular, we establish a precise large deviation result for a nonstandard renewal risk model in which innovations, modelled as real-valued random variables, are negatively dependent with common consistently-varying-tailed distribution, and their inter-arrival times are also negatively dependent.
Keywords: Consistent variation; Counting process; Lower/upper extended negative dependence; Precise large deviation; Uniformity; 60F10; 60E15; 62H20; 62E20 (search for similar items in EconPapers)
Date: 2011
References: View references in EconPapers View complete reference list from CitEc
Citations: View citations in EconPapers (5)
Downloads: (external link)
http://link.springer.com/10.1007/s11009-010-9194-7 Abstract (text/html)
Access to the full text of the articles in this series is restricted.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:spr:metcap:v:13:y:2011:i:4:d:10.1007_s11009-010-9194-7
Ordering information: This journal article can be ordered from
https://www.springer.com/journal/11009
DOI: 10.1007/s11009-010-9194-7
Access Statistics for this article
Methodology and Computing in Applied Probability is currently edited by Joseph Glaz
More articles in Methodology and Computing in Applied Probability from Springer
Bibliographic data for series maintained by Sonal Shukla () and Springer Nature Abstracting and Indexing ().