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Statistical Process Control using Shewhart Control Charts with Supplementary Runs Rules

M. V. Koutras (), S. Bersimis and P. E. Maravelakis
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M. V. Koutras: University of Piraeus
S. Bersimis: University of Piraeus
P. E. Maravelakis: University of Piraeus

Methodology and Computing in Applied Probability, 2007, vol. 9, issue 2, 207-224

Abstract: Abstract The aim of this paper is to present the basic principles and recent advances in the area of statistical process control charting with the aid of runs rules. More specifically, we review the well known Shewhart type control charts supplemented with additional rules based on the theory of runs and scans. The motivation for this article stems from the fact that during the last decades, the performance improvement of the Shewhart charts by exploiting runs rules has attracted continuous research interest. Furthermore, we briefly discuss the Markov chain approach which is the most popular technique for studying the run length distribution of run based control charts.

Keywords: Statistical process control; Control charts; Shewhart; Runs rules; Scans rules; Patterns; Markov chain; Average run length; 62N10 (search for similar items in EconPapers)
Date: 2007
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DOI: 10.1007/s11009-007-9016-8

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