The Relationship of the Degree of Exposure to a Technological Disaster and Emotional Response: A Structural Model Approach

Adolfo Esparcia and Joan Guárdia Olmos

Quality & Quantity: International Journal of Methodology, 2001, vol. 35, issue 2, 171 pages

Keywords: Post-traumatic stress disorder; technological disaster; depression; structural models (search for similar items in EconPapers)
Date: 2001
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Persistent link: https://EconPapers.repec.org/RePEc:spr:qualqt:v:35:y:2001:i:2:p:161-171

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DOI: 10.1023/A:1010364325879

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