Normal Approximation to the Distribution of the Estimated Yield Index S pk

W. Pearn, G. Lin and K. Wang

Quality & Quantity: International Journal of Methodology, 2004, vol. 38, issue 1, 95-111

Keywords: critical value; process yield (search for similar items in EconPapers)
Date: 2004
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Citations: View citations in EconPapers (2)

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DOI: 10.1023/B:QUQU.0000013245.13104.1d

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