Economics at your fingertips  

Patent citation indicators: One size fits all?

Jurriën Bakker (), Dennis Verhoeven (), Lin Zhang () and Bart Van Looy ()
Additional contact information
Jurriën Bakker: KU Leuven
Dennis Verhoeven: KU Leuven
Lin Zhang: KU Leuven
Bart Van Looy: KU Leuven

Scientometrics, 2016, vol. 106, issue 1, 187-211

Abstract: Abstract The number of citations that a patent receives is considered an important indicator of the quality and impact of the patent. However, a variety of methods and data sources can be used to calculate this measure. This paper evaluates similarities between citation indicators that differ in terms of (a) the patent office where the focal patent application is filed; (b) whether citations from offices other than that of the application office are considered; and (c) whether the presence of patent families is taken into account. We analyze the correlations between these different indicators and the overlap between patents identified as highly cited by the various measures. Our findings reveal that the citation indicators obtained differ substantially. Favoring one way of calculating a citation indicator over another has non-trivial consequences and, hence, should be given explicit consideration. Correcting for patent families, especially when using a broader definition (INPADOC), provides the most uniform results.

Keywords: Patent citations; EPO; USPTO; PCT; Patent family; Multivariate analysis; 62H20; 62H25; 62H30 (search for similar items in EconPapers)
JEL-codes: O34 (search for similar items in EconPapers)
Date: 2016
References: View references in EconPapers View complete reference list from CitEc
Citations View citations in EconPapers (5) Track citations by RSS feed

Downloads: (external link) Abstract (text/html)
Access to the full text of the articles in this series is restricted.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link:

Ordering information: This journal article can be ordered from

Access Statistics for this article

Scientometrics is currently edited by Wolfgang Glänzel

More articles in Scientometrics from Springer, Akadémiai Kiadó
Series data maintained by Sonal Shukla ().

Page updated 2017-10-06
Handle: RePEc:spr:scient:v:106:y:2016:i:1:d:10.1007_s11192-015-1786-0