Measuring relatedness between technological fields

Si Hyung Joo and Yeonbae Kim ()
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Si Hyung Joo: Seoul National University
Yeonbae Kim: Seoul National University

Scientometrics, 2010, vol. 83, issue 2, No 8, 435-454

Abstract: Abstract Intensified technology convergence, increasing relatedness between technological fields, is a mega-trend in 21st century science and technology. However, scientometrics has been unsuccessful in identifying this techno-economic paradigm change. To address the limitations and validity problems of conventional measures of technology convergence, we introduce a multi-dimensional contingency table representation of technological field co-occurrence and a relatedness measure based on the Mantel–Haenszel common log odds ratio. We used Korean patent data to compare previous and proposed methods. Results show that the proposed method can increase understanding of the techno-economic paradigm change because it reveals significant changes in technological relatedness over time.

Keywords: Relatedness; IPC co-occurrence; Incomplete multi-dimensional contingency table; Mantel–Haenszel common odds ratio (search for similar items in EconPapers)
Date: 2010
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Citations: View citations in EconPapers (20)

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DOI: 10.1007/s11192-009-0108-9

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