Statistical analysis of process capability indices with measurement errors: The case ofC p

Silvano Bordignon () and Michele Scagliarini ()
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Silvano Bordignon: Dipartimento di Scienze Statistiche

Statistical Methods & Applications, 2001, vol. 10, issue 1, No 19, 273-285

Abstract: Abstract Process capability indices (PCIs) have been widely used in manufacturing industries to previde a quantitative measure of process potential and performance. While some efforts have been dedicated in the literature to the statistical properties of PCIs estimators, scarce attention has been given to the evaluation of these properties when sample data are affected by measurement errors. In this work we deal with the problem of measurement errors effects on the performance of PCIs. The analysis is illustrated with reference toC p , i.e. the simplest and most common measure suggested to evaluate process capability.

Keywords: Process capability indices; measurement errors; C p; estimation (search for similar items in EconPapers)
Date: 2001
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DOI: 10.1007/BF02511652

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