A dirichlet process elaboration diagnostic for binomial goodness of fit

Cinzia Carota and Giovanni Parmigiani

TEST: An Official Journal of the Spanish Society of Statistics and Operations Research, 1998, vol. 7, issue 1, 133-145

Keywords: Bayesian model criticism; binomial data; logarithmic divergence; chi-square statistics; 62G10; 62P99 (search for similar items in EconPapers)
Date: 1998
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DOI: 10.1007/BF02565106

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