Technology strategy for enhancing the public-to-private technology transfer: evidence from the duration of patent
Yoon-Jun Lee and
Jeong-Dong Lee ()
Applied Economics, 2007, vol. 40, issue 2, 229-240
Abstract:
Patents are typically characterized as assets of great values. Nevertheless, there are many patents that are actually never used. In this article, we claim that there is a relationship between the duration of patents and the characteristics of the underlying invention. From the viewpoint of Public Research Institutes, the duration of patents may be a proxy of probability of technology transfer because the long lived patents have higher value and more chances to be transferred. We characterize the patents along different dimensions captured by the renewal and application data, i.e. collaboration, scope, competitiveness and attractiveness. The results of hazard rate duration analysis tell us that long lived patents are characterized by being more focused, having more competitiveness, and being more collaborative. In addition, it is analysed that patents in chemical industry expire faster than those in electrical/electronic industry. Though this fact is against the general intuition, it may be reasonable from a viewpoint of technology transfer.
Date: 2007
References: View references in EconPapers View complete reference list from CitEc
Citations:
Downloads: (external link)
http://www.tandfonline.com/doi/abs/10.1080/00036840600749854 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:applec:v:40:y:2007:i:2:p:229-240
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/RAEC20
DOI: 10.1080/00036840600749854
Access Statistics for this article
Applied Economics is currently edited by Anita Phillips
More articles in Applied Economics from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().