A survival analysis of patent examination requests by Japanese electrical and electronic manufacturers

Yoshifumi Nakata and Xingyuan Zhang

Economics of Innovation and New Technology, 2012, vol. 21, issue 1, 31-54

Abstract: Our research on patent filing in Japan identified major determinants of the time between application filing and the lodging of an examination request, and considered the influence of two factors on requests: patent value indices, as well as patent filing and innovation strategies. Our sample covered patent applications of 214 listed Japanese electrical and electronics manufacturers during 1988--2001. The empirical results show that, in the early 1990s, large firms and those with high R&D intensity and patent propensity tended to delay requests; in the late 1990s, their requests accelerated, with those for applications likely to be granted being lodged earlier. Meanwhile, such patent value indices as degree of originality, number of self-citations and external citations had a positive correlation to early examination requests for most periods covered in the sample; joint application and generality showed mixed effects; and such time-varying factors as competitive filings produced diverse results.

Date: 2012
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DOI: 10.1080/10438599.2010.537897

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