“Silicon trade policies” and a comparative analysis of China-U.S. and Japan-U.S. trade conflicts
K. C. Fung,
Nathalie Aminian,
Xiaoqing (Maggie) Fu,
Jung Ho Rhee and
Chris Y. Tung
Journal of Chinese Economic and Business Studies, 2020, vol. 18, issue 1, 29-50
Abstract:
In this paper, we first compare the U.S.-Japan trade conflicts of the 1980s and 1990s with the current 21st century Trump Administration U.S.-China trade wars. Topics to be compared include complaints of bilateral trade imbalances, ‘unique’ economic or business organizations and exchange rate manipulations. Relevant contemporaneous research and policy lessons are drawn from the management of previous U.S.-Japan trade disputes and their potential applicability to the ongoing U.S.-China trade rivalry. Since one of the major differences between the periods of the two major trade conflicts is the emergence and prevalence of digital companies, we provide here a formal model of digital firm and see how some ‘Silicon trade policies’ such as being put on an ‘Entity List’, being blocked from European technology market and exchange rate depreciation can affect these networked companies.
Date: 2020
References: Add references at CitEc
Citations:
Downloads: (external link)
http://hdl.handle.net/10.1080/14765284.2020.1731785 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:jocebs:v:18:y:2020:i:1:p:29-50
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/RCEA20
DOI: 10.1080/14765284.2020.1731785
Access Statistics for this article
Journal of Chinese Economic and Business Studies is currently edited by Professor Xiaming Liu
More articles in Journal of Chinese Economic and Business Studies from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().