Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes

Chih-chun Tsai and Chien-tai Lin

Communications in Statistics - Theory and Methods, 2014, vol. 43, issue 10-12, 2419-2428

Abstract: Manufacturers are often faced with the problem of how to select the most reliable design among several competing designs in the stage of development. It becomes complicated if products are highly reliable. Under the circumstances, recent work has focused on the study with degradation data by assuming that degradation paths follow Wiener processes or random-effect models. However, it is more appropriate to use gamma processes to model degradation data with monotone-increasing pattern. This article deals with the selection problem for such processes. With a minimum probability of correct decision, optimal test plans can be obtained by minimizing the total cost.

Date: 2014
References: Add references at CitEc
Citations: View citations in EconPapers (1)

Downloads: (external link)
http://hdl.handle.net/10.1080/03610926.2013.804562 (text/html)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:taf:lstaxx:v:43:y:2014:i:10-12:p:2419-2428

Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/lsta20

DOI: 10.1080/03610926.2013.804562

Access Statistics for this article

Communications in Statistics - Theory and Methods is currently edited by Debbie Iscoe

More articles in Communications in Statistics - Theory and Methods from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().