Developing a variables two-plan sampling system for product acceptance determination

Chien-Wei Wu, Muhammad Aslam and Chi-Hyuck Jun

Communications in Statistics - Theory and Methods, 2017, vol. 46, issue 2, 706-720

Abstract: In this paper, a variables tightened-normal-tightened (TNT) two-plan sampling system based on the widely used capability index Cpk is developed for product acceptance determination when the quality characteristic of products has two-sided specification limits and follows a normal distribution. The operating procedure and operating characteristic (OC) function of the variables TNT two-plan sampling system, and the conditions for solving plan parameters are provided. The behavior of OC curves for the variables TNT sampling system under various parameters is also studied, and compared with the variables single tightened inspection plan and single normal inspection plan.

Date: 2017
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DOI: 10.1080/03610926.2015.1004092

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