Capability index-based control chart for monitoring process mean using repetitive sampling

Olatunde A. Adeoti and John O. Olaomi

Communications in Statistics - Theory and Methods, 2018, vol. 47, issue 2, 493-507

Abstract: A new process capability index (PCI) control chart for monitoring the process mean using repetitive sampling is presented. The design of the proposed control chart is based on an unbiased estimator σ^=s‾c4$\hat{\sigma } = \frac{{\bar{s}}}{{{c_4}}}$ of the process standard deviation for a normally distributed quality characteristic. The formulae for the in-control and out-of-control average run length and the standard deviation of the run length (SDRL) are derived. Tables of in-control and out-of-control average run length (ARL) and SDRL for various shifts, δ are presented. The proposed control chart outperforms existing control chart in detecting relatively small process mean shifts in terms of ARLs and SDRLs. Numerical example is presented to demonstrate the application of the proposed chart.

Date: 2018
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DOI: 10.1080/03610926.2017.1307401

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