Dual response surface optimization using a process “capability” index

Michael Bendersky, Noam Barak and Yisrael Parmet

Communications in Statistics - Theory and Methods, 2022, vol. 51, issue 20, 7006-7020

Abstract: Dual Response Surface Methodology is a powerful tool for simultaneously optimizing the mean and the variance of a quality characteristic in the field of quality engineering. The optimization of dual response systems to achieve better quality has played a major role in the design of industrial products and processes. In this paper we suggest using a process capability index - Cpk - as the objective function. We show by ways of multiple examples that this method improves the obtained yield of a process for different response variable types.

Date: 2022
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DOI: 10.1080/03610926.2020.1869990

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