Integrated QSS-RS plans based on the process yield index for lot acceptance determination

Atefe Banihashemi, Mohammad Saber Fallah Nezhad, Amirhossein Amiri and Michael B. C. Khoo

Communications in Statistics - Theory and Methods, 2023, vol. 52, issue 23, 8584-8606

Abstract: Acceptance sampling plans based on the process yield indices have been adopted in the inspection of outgoing and incoming lots when the required fraction defective is very low. To achieve this aim and increase their overall efficiency and flexibility, various sampling plans have been constructed for different purposes using numerous methods. In practice, resubmitted sampling (RS) plan encourages suppliers to work harder to produce better quality products that pass the first inspection. Besides, the concept of switching inspection rules, which can provide a flexible sampling procedure and reducing the required sample size for inspection, is especially useful when the inspection is costly or destructive. This paper proposes integrated sampling plans by considering the merits of the process yield index Spk, RS, and switching inspection rules for controlling lot fraction nonconforming when the quality characteristic is normally distributed with two specification limits. The performance of the proposed plans is investigated and the results indicate a satisfactory performance of the proposed plans. Besides, the advantages of the proposed plans over the existing plans are discussed. Finally, real data from the spark plug industry are used to illustrate the implementation.

Date: 2023
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DOI: 10.1080/03610926.2022.2065303

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