Bayes estimator of process capability index Cpk with a specified prior mean

Shun Matsuura

Communications in Statistics - Theory and Methods, 2023, vol. 52, issue 7, 2215-2227

Abstract: Process capability indices such as Cp, CpL, CpU, and Cpk have been used for evaluating the performance of a manufacturing process in statistical quality control and statistical process control fields. In this paper, a Bayes estimator of Cpk is constructed such that the prior mean is set to be equal to a specified value while the prior distribution is weakly informative. This estimator is compared with conventional Bayes and non Bayes estimators.

Date: 2023
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DOI: 10.1080/03610926.2021.1947508

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