Coding DGS resonator sensor for ultra-high Q-factor dielectric thickness detection
Zhong-Liang Zhou,
Cong Wang,
Alok Kumar,
Dan-Qing Zou,
Yu-Chen Wei,
Luqman Ali and
Meng Zhao
Journal of Electromagnetic Waves and Applications, 2021, vol. 35, issue 11, 1464-1476
Abstract:
In this paper, a high Q-factor-based defective ground structure (DGS) etched microwave resonator is demonstrated to identify the unknown thickness of non-destructive monolayer dielectric material. The proposed structure consists of coupled sharp-edged split-square resonator (CS-SSR), a high-impedance microstrip line, and symmetrically coded DGS optimized by adaptive genetic algorithm (AGA), which is evaluated through simulation and experiment assessment. AGA is applied to obtain ultra-high quality factor (Q-factor) using a robust calculation model with rapid convergence speed. The high Q-factor leads to high sensitivity, better accuracy, and enhanced resolution of the microwave sensor. Furthermore, the comparison of the results between the codeless, asymmetrical, and symmetrical DGS resonator illustrates that the symmetrical coding DGS resonator with higher sensitivity and better performance for dielectric material thickness detection sensors.
Date: 2021
References: Add references at CitEc
Citations:
Downloads: (external link)
http://hdl.handle.net/10.1080/09205071.2021.1895896 (text/html)
Access to full text is restricted to subscribers.
Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.
Export reference: BibTeX
RIS (EndNote, ProCite, RefMan)
HTML/Text
Persistent link: https://EconPapers.repec.org/RePEc:taf:tewaxx:v:35:y:2021:i:11:p:1464-1476
Ordering information: This journal article can be ordered from
http://www.tandfonline.com/pricing/journal/tewa20
DOI: 10.1080/09205071.2021.1895896
Access Statistics for this article
Journal of Electromagnetic Waves and Applications is currently edited by Mohamad Abou El-Nasr and Pankaj Kumar Choudhury
More articles in Journal of Electromagnetic Waves and Applications from Taylor & Francis Journals
Bibliographic data for series maintained by Chris Longhurst ().