Multi-band microwave sensor based on Hilbert’s fractal for dielectric solid material characterization

C. P. do N. Silva, J. A. I. Araujo, M. S. Coutinho, M. R. T. de Oliveira, I. Llamas-Garro and M. T. de Melo

Journal of Electromagnetic Waves and Applications, 2021, vol. 35, issue 7, 848-860

Abstract: A planar sensor designed using the fourth Hilbert fractal curve iteration for solid material characterization at multiple frequencies is reported in this paper. The fractal curve is self-similar with space-filling properties. The Hilbert fractal geometry is used to form a compact resonator, with a multiband frequency response where miniaturization is achieved since a large transmission line length is effectively confined in a limited area. The sensor provides five resonances in the frequency range from 0 to 5 GHz. The resonant frequencies are 0.56, 1.68, 2.72, 3.69 and 4.72 GHz, all used to measure the real permittivity of known samples with a sensitivity of 7, 20, 27, 43 and 50 MHz/permittivity, respectively. The sensor is used to measure dielectric samples with 20 × 20 mm2 areas with several thicknesses. Simulations and measurements demonstrate that the Hilbert fractal geometry can be used to design a multiband planar sensor for solid dielectric material characterization.

Date: 2021
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DOI: 10.1080/09205071.2020.1861992

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