 The construction of production performance prediction system for semiconductor manufacturing with artificial neural networksC.-L. Huang International Journal of Production Research, 1999, vol. 37, issue 6, 1387-1402 Abstract: The major performance measurements for wafer fabrication system comprise WIP level, throughput and cycle time. These measurements are influenced by various factors, including machine breakdown, operator absence, poor dispatching rules, emergency order and material shortage. Generally, production managers use the WIP level profile of each stage to identify an abnormal situation, and then make corrective actions. However, such a measurement is reactive, not proactive. Proactive actions must effectively predict the future performance, analyze the abnormal situation, and then generate corrective actions to prevent performance from degrading. This work systematically constructs artificial neural network models to predict production performances for a semiconductor manufacturing factory. An application for a local DRAM wafer fabrication has demonstrated the accuracy of neural network models in predicting production performances. Date: 1999 Downloads: (external link) Related works: Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text Persistent link: https://EconPapers.repec.org/RePEc:taf:tprsxx:v:37:y:1999:i:6:p:1387-1402 Ordering information: This journal article can be ordered from Access Statistics for this article International Journal of Production Research is currently edited by Professor A. Dolgui More articles in International Journal of Production Research from Taylor & Francis Journals |
Is your work missing from RePEc? Here is how to contribute.
Questions or problems? Check the EconPapers FAQ or send mail to .
EconPapers is hosted by the
School of Business at Örebro University.