Automatic virtual metrology for wheel machining automation

Haw-Ching Yang, Hao Tieng and Fan-Tien Cheng

International Journal of Production Research, 2016, vol. 54, issue 21, 6367-6377

Abstract: Total inspection after wheel machining becomes essential for safety consideration and continuous improvement. However, conducting wheel-by-wheel actual metrology is very expensive and time-consuming. A novel idea is to use virtual metrology (VM) that predicts wheel quality based on process data collected from machine tool with a slight supplement of actual metrology data. The technology of automatic virtual metrology (AVM) has been proposed by the authors and successfully deployed in hi-tech industries, such as semiconductor, display and solar cell. The purpose of this study was to propose an approach to apply the AVM system factory-wide to wheel machining automation (WMA) for achieving total inspection of all the precision items of WMA under mass production environment.

Date: 2016
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DOI: 10.1080/00207543.2015.1109724

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