Canadian Manufacturing, U.S. R&D Spillovers, And Communication Infrastructure

Jeffrey Bernstein

The Review of Economics and Statistics, 2000, vol. 82, issue 4, 608-615

Abstract: Canada is highly integrated with the U.S. economy. This north-south link, coupled with its east-west dimension, also renders Canadian production dependent on communication infrastructure. We investigate the influence of research and development (R&D) spillovers from U.S. manufacturing and Canadian communication infrastructure on Canadian manufacturing. Canadian production becomes relatively more R&D-intensive from communication spillovers. However, manufacturers substitute knowledge from U.S. spillovers for domestic R&D. U.S. spillovers cause production to become more plant- and equipment-intensive. Spillovers also enhance productivity. Communication infrastructure accounted for 8.5% of the growth, with the major source emanating from U.S. spillovers. They contributed 76% of the gains. © 2000 by the President and Fellows of Harvard College and the Massachusetts Institute of Technology

Date: 2000
References: Add references at CitEc
Citations: View citations in EconPapers (9)

Downloads: (external link)
http://www.mitpressjournals.org/doi/pdf/10.1162/003465300559082 (application/pdf)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:tpr:restat:v:82:y:2000:i:4:p:608-615

Ordering information: This journal article can be ordered from
https://mitpressjour ... rnal/?issn=0034-6535

Access Statistics for this article

The Review of Economics and Statistics is currently edited by Pierre Azoulay, Olivier Coibion, Will Dobbie, Raymond Fisman, Benjamin R. Handel, Brian A. Jacob, Kareen Rozen, Xiaoxia Shi, Tavneet Suri and Yi Xu

More articles in The Review of Economics and Statistics from MIT Press
Bibliographic data for series maintained by The MIT Press ().