Multistate Models For Clustered Duration Data - An Application To Workplace Effects On Individual Sickness Absenteeism

Maarten Lindeboom () and Marcel Kerkhofs

The Review of Economics and Statistics, 2000, vol. 82, issue 4, 668-684

Abstract: Sickness absenteeism figures show a relatively large amount of variation across firms and organizations, indicating substantial within-firm correlations between absenteeism records of individual workers. To study the role of firm-specific circumstances and workforce composition, we specify three-state, multicycle duration models of work, sickness, and job separation, with workplace-specific fixed effects to account for unobserved differences between firms. In the most flexible specification, these fixed effects are separate, nonparametric, baseline hazards for each firm and each type of transition. Alternative estimation methods are discussed and applied to individual absenteeism histories of primary-school teachers. © 2000 by the President and Fellows of Harvard College and the Massachusetts Institute of Technology

Date: 2000
References: Add references at CitEc
Citations: View citations in EconPapers (19)

Downloads: (external link)
http://www.mitpressjournals.org/doi/pdf/10.1162/003465300559000 (application/pdf)
Access to full text is restricted to subscribers.

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:tpr:restat:v:82:y:2000:i:4:p:668-684

Ordering information: This journal article can be ordered from
https://mitpressjour ... rnal/?issn=0034-6535

Access Statistics for this article

The Review of Economics and Statistics is currently edited by Pierre Azoulay, Olivier Coibion, Will Dobbie, Raymond Fisman, Benjamin R. Handel, Brian A. Jacob, Kareen Rozen, Xiaoxia Shi, Tavneet Suri and Yi Xu

More articles in The Review of Economics and Statistics from MIT Press
Bibliographic data for series maintained by The MIT Press ().