Localized Knowledge Spillovers and Patent Citations: A Distance-Based Approach

Yasusada Murata, Ryo Nakajima, Ryosuke Okamoto and Ryuichi Tamura
Additional contact information
Ryosuke Okamoto: National Graduate Institute for Policy Studies
Ryuichi Tamura: Institute of Innovation Research, Hitotsubashi University

The Review of Economics and Statistics, 2014, vol. 96, issue 5, 967-985

Abstract: We develop a new distance-based test of localized knowledge spillovers that embeds the concept of control patents. Using microgeographic data, we identify localization distance for each technology class while allowing for spillovers across geographic units. We revisit the debate between Thompson and Fox-Kean (2005a, 2005b) and Henderson, Jaffe, and Trajtenberg (2005) on the existence of localized knowledge spillovers and find solid evidence supporting localization even when using finely grained controls. Unless biases induced by imperfect matching between citing and control patents due to unobserved heterogeneity are extremely large, our distance-based test detects localization for the majority of technology classes.

Keywords: localized knowledge spillovers; patent citation; distance-based tests (search for similar items in EconPapers)
JEL-codes: O31 R12 (search for similar items in EconPapers)
Date: 2014
References: Add references at CitEc
Citations: View citations in EconPapers (88)

Downloads: (external link)
http://www.mitpressjournals.org/doi/pdf/10.1162/REST_a_00422 link to full text pdf (application/pdf)
Access to full text is restricted to subscribers.

Related works:
Working Paper: Localized knowledge spillovers and patent citations: A distance-based approach (2011)
Working Paper: Localized knowledge spillovers and patent citations: A distance-based approach (2011)
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:tpr:restat:v:96:y:2014:i:5:p:967-985

Ordering information: This journal article can be ordered from
https://mitpressjour ... rnal/?issn=0034-6535

Access Statistics for this article

The Review of Economics and Statistics is currently edited by Pierre Azoulay, Olivier Coibion, Will Dobbie, Raymond Fisman, Benjamin R. Handel, Brian A. Jacob, Kareen Rozen, Xiaoxia Shi, Tavneet Suri and Yi Xu

More articles in The Review of Economics and Statistics from MIT Press
Bibliographic data for series maintained by The MIT Press ().