Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

Mišík Jozef (), Pekarčíková Marcela () and Janovec Jozef ()
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Mišík Jozef: Slovak University of Technology in Bratislava, Faculty of Materials Science and Technology in Trnava, Paulínska 16, 917 24 Trnava
Pekarčíková Marcela: Slovak University of Technology in Bratislava, Faculty of Materials Science and Technology in Trnava, Paulínska 16, 917 24 Trnava
Janovec Jozef: Slovak University of Technology in Bratislava, Faculty of Materials Science and Technology in Trnava, Paulínska 16, 917 24 Trnava

Research Papers Faculty of Materials Science and Technology Slovak University of Technology, 2014, vol. 22, issue 341, 137-142

Abstract: (RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.

Keywords: (RE)BCO thin film; HTS tape; outgrowths; PLD; MOCVD (search for similar items in EconPapers)
Date: 2014
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Persistent link: https://EconPapers.repec.org/RePEc:vrs:repfms:v:22:y:2014:i:341:p:6:n:20

DOI: 10.2478/rput-2014-0020

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