Trace Elements Analysis by Pixe Spectroscopy

Beňo Matúš (), Dobrovodský Jozef (), Vaňa Dušan (), Minárik Stanislav () and Riedlmajer Róbert ()
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Beňo Matúš: Slovak University Of Technology In Bratislava, Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute, Ulica Jána Bottu 2781/25, 917 24Trnava
Dobrovodský Jozef: Slovak University Of Technology In Bratislava, Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute, Ulica Jána Bottu 2781/25, 917 24Trnava
Vaňa Dušan: Slovak University Of Technology In Bratislava, Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute, Ulica Jána Bottu 2781/25, 917 24Trnava
Minárik Stanislav: Slovak University Of Technology In Bratislava, Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute, Ulica Jána Bottu 2781/25, 917 24Trnava
Riedlmajer Róbert: Slovak University Of Technology In Bratislava, Faculty Of Materials Science And Technology In Trnava, Advanced Technologies Research Institute, Ulica Jána Bottu 2781/25, 917 24Trnava

Research Papers Faculty of Materials Science and Technology Slovak University of Technology, 2018, vol. 26, issue 43, 25-32

Abstract: The trace element analysis system is presented using Proton Induced X-ray Emission (PIXE) analysis at a new Ion Beam Centre in Trnava. Standard PIXE system dedicated to the measurement of thick solid samples was extended by a new application for trace element analysis in aerosol samples. The sample holder was modified with respect to the dimensions of the aerosol filters, and a new sample holder and a Faraday cup (FC) were made. The first results of the PIXE aerosol analysis are presented in this paper. Furthermore, the geometric efficiency of the detection system was verified using 55Fe radioactive source emitting monoenergetic Mn X-ray lines. The measured data were compared with the Monte Carlo simulations regarding/disregarding the X-ray attenuation.

Keywords: PIXE; trace elements; ion beam; aerosol; geometric efficiency (search for similar items in EconPapers)
Date: 2018
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Persistent link: https://EconPapers.repec.org/RePEc:vrs:repfms:v:26:y:2018:i:43:p:25-32:n:3

DOI: 10.2478/rput-2018-0027

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