Methods for planning repeated measures accelerated degradation tests

Brian P. Weaver and William Q. Meeker

Applied Stochastic Models in Business and Industry, 2014, vol. 30, issue 6, 658-671

Abstract: Repeated measures accelerated degradation tests can sometimes be used to assess product or component reliability when one would expect few or even no failures during a study. Such tests can be used to estimate the lifetime distributions of highly reliable items. This paper describes methods for selecting a single‐variable accelerated repeated measures degradation test plan when the (possibly transformed) degradation that is linear in (possibly transformed) time and unit‐to‐unit variability is described by a random‐effects model. To find optimum test plans, we use a criterion based on a large‐sample approximation to the estimation precision of a quantile of the failure‐time distribution at use conditions. We also discuss how to find compromise test plans that satisfy practical constraints. We use the general equivalence theorem to verify that a test plan is globally optimum. The resulting optimized plans are also evaluated using simulation and compared with other test plans. Copyright © 2014 John Wiley & Sons, Ltd.

Date: 2014
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Persistent link: https://EconPapers.repec.org/RePEc:wly:apsmbi:v:30:y:2014:i:6:p:658-671

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