A study of different ageing classes via total time on test transform and Lorenz curves

Rafael Pérez‐Ocón, M. Luz Gámiz‐Pérez and J. Eloy Ruíz‐Castro

Applied Stochastic Models and Data Analysis, 1997, vol. 13, issue 3‐4, 241-248

Abstract: A device subject to shocks occurring randomly according to a general counting process and failing when the cumulative damage exceeds a fixed threshold is considered. Sufficient conditions for the lifetime of this device belonging to the HNBUE class are given and as a consequence a procedure to obtain an HNBUE sample is performed. A computational program is implemented to obtain an HNBUE sample. Moreover, another computational program has been implemented to check whether these values belong to a smaller class than HNBUE by means of known graphic procedures, namely Lorenz and TTT curves. © 1998 John Wiley & Sons, Ltd.

Date: 1997
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https://doi.org/10.1002/(SICI)1099-0747(199709/12)13:3/43.0.CO;2-D

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Persistent link: https://EconPapers.repec.org/RePEc:wly:apsmda:v:13:y:1997:i:3-4:p:241-248

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