A minmax search for the critical level of a system: The asymmetric case

Noomi Abigadol and Aharon Ben‐Tal

Naval Research Logistics Quarterly, 1985, vol. 32, issue 1, 137-154

Abstract: We consider a system composed of k components, each of which is subject to failure if temperature is above a critical level. The failure of one component causes the failure of the system as a whole (a serially connected system). If zi is the critical temperature of the ith component then z* = min{zi: i = 1,2,…, k} is the critical level of the system. The components may be tested individually at different temperature levels, if the temperature is below the critical level the cost is $1, otherwise the test is destructive and the cost is m > 1 dollars. The purpose of this article is to construct, under a budgetary constraint, an efficient (in a minmax sense) testing procedure which will locate the critical level of the system with maximal accuracy.

Date: 1985
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Persistent link: https://EconPapers.repec.org/RePEc:wly:navlog:v:32:y:1985:i:1:p:137-154

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