Present practices and future plans for MIL‐STD‐781

W. E. Wallace

Naval Research Logistics Quarterly, 1985, vol. 32, issue 1, 21-26

Abstract: MIL‐STD‐781 specifies reliability acceptance test procedures based on both fixed‐length tests and probability ratio sequential tests. The assumption underlying MIL‐STD‐781 is a constant mean time between failures (MTBF) and typical practice applies MIL‐STD‐781 to electrical, electronic, and mechanical equipment. This article discusses some of the difficulties that have prompted the C and D revisions of MIL‐STD‐781. In addition, it discusses the relationship of MIL‐STD‐781 with MIL‐STD‐1635(EC) which deals with reliability growth testing. The article concludes with a discussion of needed research in reliability growth testing, in support of MIL‐STD‐781, and in the area of stress and its impact of MTBF.

Date: 1985
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Persistent link: https://EconPapers.repec.org/RePEc:wly:navlog:v:32:y:1985:i:1:p:21-26

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