Skewness correction X̄ and R charts for skewed distributions

Lai K. Chan and Heng J. Cui

Naval Research Logistics (NRL), 2003, vol. 50, issue 6, 555-573

Abstract: This paper proposes a skewness correction (SC) method for constructing the $\bar{X}$ and R control charts for skewed process distributions. Their asymmetric control limits (about the central line) are based on the degree of skewness estimated from the subgroups, and no parameter assumptions are made on the form of process distribution. These charts are simply adjustments of the conventional Shewhart control charts. Moreover, the $\bar{X}$ chart is almost the same as the Shewhart $\bar{X}$ chart if the process distribution is known to be symmetrical. The new charts are compared with the Shewhart charts and weighted variance (WV) control charts. When the process distribution is in some neighborhood of Weibull, lognormal, Burr or binomial family, simulation shows that the SC control charts have Type I risk (i.e., probability of a false alarm) closer to 0.27% of the normal case. Even in the case where the process distribution is exponential with known mean, not only the control limits and Type I risk, but also the Type II risk of the SC charts are closer to those of the exact $\bar{X}$ and R charts than those of the WV and Shewhart charts. © 2003 Wiley Periodicals, Inc. Naval Research Logistics 50: 555–573, 2003

Date: 2003
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