Development programs for one‐shot systems using multiple‐state design reliability models

Suntichai Shevasuthisilp and Stephen B. Vardeman

Naval Research Logistics (NRL), 2004, vol. 51, issue 6, 873-892

Abstract: Design reliability at the beginning of a product development program is typically low, and development costs can account for a large proportion of total product cost. We consider how to conduct development programs (series of tests and redesigns) for one‐shot systems (which are destroyed at first use or during testing). In rough terms, our aim is to both achieve high final design reliability and spend as little of a fixed budget as possible on development. We employ multiple‐state reliability models. Dynamic programming is used to identify a best test‐and‐redesign strategy and is shown to be presently computationally feasible for at least 5‐state models. Our analysis is flexible enough to allow for the accelerated stress testing needed in the case of ultra‐high reliability requirements, where testing otherwise provides little information on design reliability change. © 2004 Wiley Periodicals, Inc. Naval Research Logistics, 2004

Date: 2004
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Persistent link: https://EconPapers.repec.org/RePEc:wly:navres:v:51:y:2004:i:6:p:873-892

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