Evaluating methods for the reliability of a large 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system

Hisashi Yamamoto and Tomoaki Akiba

Naval Research Logistics (NRL), 2005, vol. 52, issue 3, 243-252

Abstract: A 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system consists of m × n components, and fails if and only if k or more components fail in an r × s submatrix. This system can be treated as a reliability model for TFT liquid crystal displays, wireless communication networks, etc. Although an effective method has been developed for evaluating the exact system reliability of small or medium‐sized systems, that method needs extremely high computing time and memory capacity when applied to larger systems. Therefore, developing upper and lower bounds and accurate approximations for system reliability is useful for large systems. In this paper, first, we propose new upper and lower bounds for the reliability of a 2‐dimensional rectangular k‐within‐consecutive‐(r, s)‐out‐of‐(m, n):F system. Secondly, we propose two limit theorems for that system. With these theorems we can obtain accurate approximations for system reliabilities when the system is large and component reliabilities are close to one. © 2005 Wiley Periodicals, Inc. Naval Research Logistics, 2005

Date: 2005
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Persistent link: https://EconPapers.repec.org/RePEc:wly:navres:v:52:y:2005:i:3:p:243-252

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