FILMS IN TETRAGONAL STATES PRODUCED BY EPITAXIAL STRAIN

P.M. Marcus and F. Jona
Additional contact information
P.M. Marcus: Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794-2275, USA
F. Jona: Department of Materials Science and Engineering, State University of New York, Stony Brook, NY 11794-2275, USA

Surface Review and Letters (SRL), 1994, vol. 01, issue 01, 15-21

Abstract: The tetragonal states of {001} films of cubic materials produced by coherent epitaxy on cubic {001} substrates are calculated for Cu and Fe assuming Poisson ratios for the bcc and fcc structures that are constant as the material deforms. The states lie on lines, referred to as epitaxial lines, on the plane, referred to as the tetragonal plane, whose axes are the aspect ratioc/aand volume per atomV. The results of quantitative low-energy electron diffraction (QLEED) for the bulk layer spacing of coherent epitaxial films of Cu and Fe, when plotted on the tetragonal plane, show whether the films lie on the bcc or fcc epitaxial line. Strain-energy calculations along the epitaxial lines lead to a critical value of a at which a first-order transition from one epitaxial line to the other occurs; this transition is illustrated by the epitaxial films of Fe, some of which lie on the bcc line and some on the fcc line.

Date: 1994
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X94000047
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:01:y:1994:i:01:n:s0218625x94000047

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X94000047

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().