SURFACE STUDIES BY CORE-EXCITATION REFLECTION ELECTRON ENERGY LOSS SPECTROSCOPY

A.P. Hitchcock and T. Tyliszczak
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A.P. Hitchcock: Department of Chemistry and Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1, Canada
T. Tyliszczak: Department of Chemistry and Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1, Canada

Surface Review and Letters (SRL), 1995, vol. 02, issue 01, 43-61

Abstract: Inelastic electron scattering in a reflection geometry is a useful alternative to synchrotron radiation X-ray absorption spectroscopy for inner-shell excitation studies of surfaces. This article reviews the current capabilities of reflection electron energy loss spectroscopy for core-excitation studies of the electronic and geometric structure of surfaces. Issues discussed include: momentum transfer dependence, comparison to X-ray techniques, orientational sensitivity, spatial and energy resolution, and technological applications. Examples of applications to clean surfaces, atomic and molecular adsorbates, and thin films are given.

Date: 1995
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DOI: 10.1142/S0218625X95000054

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