THE EFFECT OF DEGRADATION OF DEPTH RESOLUTION ON THE INTERDIFFUSION DATA IN THIN POLYCRYSTALLINEAu-AgMULTILAYER FILMS

Antoni Bukaluk
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Antoni Bukaluk: Instytut Matematyki i Fizyki, Akademia Techniczno-Rolnicza, ul. Kaliskiego 7, 85–796 Bydgoszcz, Poland

Surface Review and Letters (SRL), 1995, vol. 02, issue 02, 191-196

Abstract: Auger electron spectroscopy (AES) in conjunction with argon-ion sputtering was used to determine the diffusion profiles in the thin-filmAu-Agmultilayer system. Interdiffusion coefficients, obtained in the temperature range of 175–250°C, have been derived from the change of the concentration amplitude of the structure and from the variation of the composition at the interface of two consecutive layers of the multilayer system. The influence of the depth resolution on the diffusion data have been analyzed and discussed.

Date: 1995
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DOI: 10.1142/S0218625X95000212

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