DETERMINATION OF THE OVERLAYER/SUBSTRATE REGISTRY INNi(1 ML)/Pt(111)BY ANGLE-SCANNED PHOTOELECTRON DIFFRACTION

M. Sambi, E. Pin and G. Granozzi
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M. Sambi: Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy
E. Pin: Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy
G. Granozzi: Dipartimento di Chimica Inorganica, Metallorganica ed Analitica, e Centro CSSRCC del, CNR, Università di Padova, via Loredan 4, 35131 Padova, Italy

Surface Review and Letters (SRL), 1995, vol. 02, issue 06, 787-793

Abstract: The site (fcc or hcp) occupied by the atoms of aNi MLdeposited onPt(111)is determined in this paper using angle-scanned photoelectron diffraction (PD). A full 2πMgKα-excitedNi-2p3/2PD pattern from1-ML Nideposited on Pt(111) is compared to single scattering cluster-spherical wave (SSC-SW) simulations and the agreement between experimental and theoretical data is quantified by R-factor analysis. From the present investigation it turns out that Ni atoms occupy hcp sites. In addition, theNi-Ptdistance has been estimated to be2.5±0.1 Å.

Date: 1995
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DOI: 10.1142/S0218625X95000716

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