QUALITATIVE AND QUANTITATIVE SURFACE ANALYSIS VIA X-RAY PHOTOEMISSION AND AUGER ELECTRON SPECTROSCOPIES

Massimo Sancrotti
Additional contact information
Massimo Sancrotti: Laboratorio Tecnologie Avanzate Superfici e Catalisi (TASC), Istituto Nazionale per la Fisica della Materia (INFM), Padriciano 99, I-34012 Trieste, Italy

Surface Review and Letters (SRL), 1995, vol. 02, issue 06, 859-883

Abstract: No abstract received.

Date: 1995
References: Add references at CitEc
Citations:

Downloads: (external link)
http://www.worldscientific.com/doi/abs/10.1142/S0218625X95000765
Access to full text is restricted to subscribers

Related works:
This item may be available elsewhere in EconPapers: Search for items with the same title.

Export reference: BibTeX RIS (EndNote, ProCite, RefMan) HTML/Text

Persistent link: https://EconPapers.repec.org/RePEc:wsi:srlxxx:v:02:y:1995:i:06:n:s0218625x95000765

Ordering information: This journal article can be ordered from

DOI: 10.1142/S0218625X95000765

Access Statistics for this article

Surface Review and Letters (SRL) is currently edited by S Y Tong

More articles in Surface Review and Letters (SRL) from World Scientific Publishing Co. Pte. Ltd.
Bibliographic data for series maintained by Tai Tone Lim ().